blob: 6eac5356544c12ae2ea581f34c0005dc72be8e20 [file] [log] [blame]
#ifndef _VKTPROTECTEDMEMATTACHMENTCLEARTESTS_HPP
#define _VKTPROTECTEDMEMATTACHMENTCLEARTESTS_HPP
/*------------------------------------------------------------------------
* Vulkan Conformance Tests
* ------------------------
*
* Copyright (c) 2017 The Khronos Group Inc.
* Copyright (c) 2017 Samsung Electronics Co., Ltd.
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*
*//*!
* \file
* \brief Protected memory attachment clear tests
*//*--------------------------------------------------------------------*/
#include "tcuDefs.hpp"
#include "tcuTestCase.hpp"
namespace vkt
{
namespace ProtectedMem
{
tcu::TestCaseGroup* createAttachmentClearTests (tcu::TestContext& testCtx);
} // ProtectedMem
} // vkt
#endif // _VKTPROTECTEDMEMATTACHMENTCLEARTESTS_HPP