| /* |
| * Copyright © 2021 Intel Corporation |
| * |
| * Permission is hereby granted, free of charge, to any person obtaining a |
| * copy of this software and associated documentation files (the "Software"), |
| * to deal in the Software without restriction, including without limitation |
| * the rights to use, copy, modify, merge, publish, distribute, sublicense, |
| * and/or sell copies of the Software, and to permit persons to whom the |
| * Software is furnished to do so, subject to the following conditions: |
| * |
| * The above copyright notice and this permission notice (including the next |
| * paragraph) shall be included in all copies or substantial portions of the |
| * Software. |
| * |
| * THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR |
| * IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, |
| * FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL |
| * THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER |
| * LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING |
| * FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER |
| * DEALINGS IN THE SOFTWARE. |
| */ |
| #include <gtest/gtest.h> |
| #include "nir.h" |
| #include "nir_builder.h" |
| #include "nir_range_analysis.h" |
| |
| class ssa_def_bits_used_test : public ::testing::Test { |
| protected: |
| ssa_def_bits_used_test() |
| { |
| glsl_type_singleton_init_or_ref(); |
| |
| static const nir_shader_compiler_options options = { }; |
| bld = nir_builder_init_simple_shader(MESA_SHADER_VERTEX, &options, |
| "ssa_def_bits_used test"); |
| } |
| |
| ~ssa_def_bits_used_test() |
| { |
| ralloc_free(bld.shader); |
| glsl_type_singleton_decref(); |
| } |
| |
| nir_alu_instr *build_alu_instr(nir_op op, nir_ssa_def *, nir_ssa_def *); |
| |
| struct nir_builder bld; |
| }; |
| |
| static bool |
| is_used_once(const nir_ssa_def *def) |
| { |
| return list_is_singular(&def->uses) && |
| list_is_empty(&def->if_uses); |
| } |
| |
| nir_alu_instr * |
| ssa_def_bits_used_test::build_alu_instr(nir_op op, |
| nir_ssa_def *src0, nir_ssa_def *src1) |
| { |
| nir_ssa_def *def = nir_build_alu(&bld, op, src0, src1, NULL, NULL); |
| |
| if (def == NULL) |
| return NULL; |
| |
| nir_alu_instr *alu = nir_instr_as_alu(def->parent_instr); |
| |
| if (alu == NULL) |
| return NULL; |
| |
| alu->dest.write_mask = 1; |
| alu->dest.dest.ssa.num_components = 1; |
| |
| return alu; |
| } |
| |
| TEST_F(ssa_def_bits_used_test, iand_with_const_vector) |
| { |
| static const unsigned src0_imm[4] = { 255u << 24, 255u << 16, 255u << 8, 255u }; |
| |
| nir_ssa_def *src0 = nir_imm_ivec4(&bld, |
| src0_imm[0], src0_imm[1], |
| src0_imm[2], src0_imm[3]); |
| nir_ssa_def *src1 = nir_imm_int(&bld, 0xffffffff); |
| |
| nir_alu_instr *alu = build_alu_instr(nir_op_iand, src0, src1); |
| |
| ASSERT_NE((void *) 0, alu); |
| |
| for (unsigned i = 0; i < 4; i++) { |
| /* If the test is changed, and somehow src1 is used multiple times, |
| * nir_ssa_def_bits_used will accumulate *all* the uses (as it should). |
| * This isn't what we're trying to test here. |
| */ |
| ASSERT_TRUE(is_used_once(src1)); |
| |
| alu->src[0].swizzle[0] = i; |
| |
| const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[1].src.ssa); |
| |
| /* The answer should be the value swizzled from src0. */ |
| EXPECT_EQ(src0_imm[i], bits_used); |
| } |
| } |
| |
| TEST_F(ssa_def_bits_used_test, ior_with_const_vector) |
| { |
| static const unsigned src0_imm[4] = { 255u << 24, 255u << 16, 255u << 8, 255u }; |
| |
| nir_ssa_def *src0 = nir_imm_ivec4(&bld, |
| src0_imm[0], src0_imm[1], |
| src0_imm[2], src0_imm[3]); |
| nir_ssa_def *src1 = nir_imm_int(&bld, 0xffffffff); |
| |
| nir_alu_instr *alu = build_alu_instr(nir_op_ior, src0, src1); |
| |
| ASSERT_NE((void *) 0, alu); |
| |
| for (unsigned i = 0; i < 4; i++) { |
| /* If the test is changed, and somehow src1 is used multiple times, |
| * nir_ssa_def_bits_used will accumulate *all* the uses (as it should). |
| * This isn't what we're trying to test here. |
| */ |
| ASSERT_TRUE(is_used_once(src1)); |
| |
| alu->src[0].swizzle[0] = i; |
| |
| const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[1].src.ssa); |
| |
| /* The answer should be the value swizzled from ~src0. */ |
| EXPECT_EQ(~src0_imm[i], bits_used); |
| } |
| } |
| |
| TEST_F(ssa_def_bits_used_test, extract_i16_with_const_index) |
| { |
| nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff); |
| |
| static const unsigned src1_imm[4] = { 9, 1, 0, 9 }; |
| |
| nir_ssa_def *src1 = nir_imm_ivec4(&bld, |
| src1_imm[0], |
| src1_imm[1], |
| src1_imm[2], |
| src1_imm[3]); |
| |
| nir_alu_instr *alu = build_alu_instr(nir_op_extract_i16, src0, src1); |
| |
| ASSERT_NE((void *) 0, alu); |
| |
| for (unsigned i = 1; i < 3; i++) { |
| /* If the test is changed, and somehow src1 is used multiple times, |
| * nir_ssa_def_bits_used will accumulate *all* the uses (as it should). |
| * This isn't what we're trying to test here. |
| */ |
| ASSERT_TRUE(is_used_once(src1)); |
| |
| alu->src[1].swizzle[0] = i; |
| |
| const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa); |
| |
| EXPECT_EQ(0xffffu << (16 * src1_imm[i]), bits_used); |
| } |
| } |
| |
| TEST_F(ssa_def_bits_used_test, extract_u16_with_const_index) |
| { |
| nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff); |
| |
| static const unsigned src1_imm[4] = { 9, 1, 0, 9 }; |
| |
| nir_ssa_def *src1 = nir_imm_ivec4(&bld, |
| src1_imm[0], |
| src1_imm[1], |
| src1_imm[2], |
| src1_imm[3]); |
| |
| nir_alu_instr *alu = build_alu_instr(nir_op_extract_u16, src0, src1); |
| |
| ASSERT_NE((void *) 0, alu); |
| |
| for (unsigned i = 1; i < 3; i++) { |
| /* If the test is changed, and somehow src1 is used multiple times, |
| * nir_ssa_def_bits_used will accumulate *all* the uses (as it should). |
| * This isn't what we're trying to test here. |
| */ |
| ASSERT_TRUE(is_used_once(src1)); |
| |
| alu->src[1].swizzle[0] = i; |
| |
| const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa); |
| |
| EXPECT_EQ(0xffffu << (16 * src1_imm[i]), bits_used); |
| } |
| } |
| |
| TEST_F(ssa_def_bits_used_test, extract_i8_with_const_index) |
| { |
| nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff); |
| |
| static const unsigned src1_imm[4] = { 3, 2, 1, 0 }; |
| |
| nir_ssa_def *src1 = nir_imm_ivec4(&bld, |
| src1_imm[0], |
| src1_imm[1], |
| src1_imm[2], |
| src1_imm[3]); |
| |
| nir_alu_instr *alu = build_alu_instr(nir_op_extract_i8, src0, src1); |
| |
| ASSERT_NE((void *) 0, alu); |
| |
| for (unsigned i = 0; i < 4; i++) { |
| /* If the test is changed, and somehow src1 is used multiple times, |
| * nir_ssa_def_bits_used will accumulate *all* the uses (as it should). |
| * This isn't what we're trying to test here. |
| */ |
| ASSERT_TRUE(is_used_once(src1)); |
| |
| alu->src[1].swizzle[0] = i; |
| |
| const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa); |
| |
| EXPECT_EQ(0xffu << (8 * src1_imm[i]), bits_used); |
| } |
| } |
| |
| TEST_F(ssa_def_bits_used_test, extract_u8_with_const_index) |
| { |
| nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff); |
| |
| static const unsigned src1_imm[4] = { 3, 2, 1, 0 }; |
| |
| nir_ssa_def *src1 = nir_imm_ivec4(&bld, |
| src1_imm[0], |
| src1_imm[1], |
| src1_imm[2], |
| src1_imm[3]); |
| |
| nir_alu_instr *alu = build_alu_instr(nir_op_extract_u8, src0, src1); |
| |
| ASSERT_NE((void *) 0, alu); |
| |
| for (unsigned i = 0; i < 4; i++) { |
| /* If the test is changed, and somehow src1 is used multiple times, |
| * nir_ssa_def_bits_used will accumulate *all* the uses (as it should). |
| * This isn't what we're trying to test here. |
| */ |
| ASSERT_TRUE(is_used_once(src1)); |
| |
| alu->src[1].swizzle[0] = i; |
| |
| const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa); |
| |
| EXPECT_EQ(0xffu << (8 * src1_imm[i]), bits_used); |
| } |
| } |