commit | 0f4bc2fde7cb4b50ebcb6f768e1f99c9cd8f5b43 | [log] [tgz] |
---|---|---|
author | Steven Moreland <smoreland@google.com> | Thu Jan 26 01:25:27 2023 +0000 |
committer | Steven Moreland <smoreland@google.com> | Fri Jan 27 23:17:48 2023 +0000 |
tree | 7420764c30233eb130b0c6111a622b59ff9dd829 | |
parent | 9dbd3c4b01a9e685f5422cf807701a304c12cd39 [diff] |
aidl_lazy_test: use MS Easier to change the test to use millisecond-level timings, so we can run the tests 100s of times a second on debug builds. Bug: 264814573 Test: aidl_lazy_test Change-Id: I5620ec83644d381867640a43c33aa118780e75eb
Documentation for this project is currently maintained here:
https://source.android.com/devices/architecture/aidl/overview